Campus Microscopy and Imaging Facility

SEM Sample Preparation

CMIF offers the following SEM services. Note that CMIF does not have a SEM microscope.
  • SEM Sample Preparation 
  • Critical Point Dryer - preserves the surface structure of specimens for SEM by removing liquid from samples without causing damage due to surface tension
  • Sputter Coater - deposits a thin layer of substrate (gold palladium) onto specimens. Commonly used to enhance specimens for SEM imaging 

Note

For SEM imaging services, please contact the Center for Electron Microscopy and Analysis.