Slide-Scanning Demonstration with CMIF and Nikon

Julia Shero from Nikon will be demonstrating NIS-Elements version 7.0 software with new and improved large image stitching and widefield slide-scanning capabilities. Bring your own slides to test out the new features of the software in BRT 245F between November 9th and 10th. You can scan up to 6 slides at a time. Please email Julia at julia.shero@nikon.com to sign up for the event and schedule time on the equipment.